Super-resolution Imaging of Sub-diffraction-limited Pattern with Superlens based on Deep Learning

Published in International Symposium on Measurement Technology and Intelligent Instrument (ISMTII 2023), 2023

Recommended citation: Y. Guan. S.Masui, S. Kadoya, M. Michihata and S. Takahashi, "Super-resolution Imaging of Sub-diffraction-limited Pattern with Superlens based on Deep Learning." ISMTII 2023, A084, Sep. 2022, Seoul, Korea.