Super-resolution Imaging of Sub-diffraction-limited Pattern with Superlens based on Deep Learning
Published in International Symposium on Measurement Technology and Intelligent Instrument (ISMTII 2023), 2023
The 11th Global Conference on Materials Science and Engineering.
Recommended citation: Y. Guan. S.Masui, S. Kadoya, M. Michihata and S. Takahashi, "Super-resolution Imaging of Sub-diffraction-limited Pattern with Superlens based on Deep Learning." ISMTII 2023, A084, Sep. 2022, Seoul, Korea.